 | 书 名: 第1卷:光学显微学,扫描探针显微学,离子显微学和纳米制造-纳米技术中的显微学手册
作 者: 姚楠
出 版 社: 清华大学
ISBN : 730211188
原 价: ￥78
 有一家网站低于85折正在热销 | 第1卷:光学显微学,扫描探针显微学,离子显微学和纳米制造-纳米技术中的显微学手册-图书目录:
1Confocal Scanning Optical Microscopy and Nanotechnology1
1.1Introduction1
1.2The Confocal Microscope3
1.2.1Principles of Confocal Microscopy3
1.2.2Instrumentation4
1.2.3Techniques for Improving Imaging of Nanoscale Materials6
1.3Applications to Nanotechnology11
1.3.1ThreeDimensional Systems12
1.3.2TwoDimensional Systems13
1.3.3OneDimensional Systems14
1.3.4ZeroDimensional Systems15
1.4Summary and Future Perspectives18
References18
2Scanning NearField Optical Microscopy in Nanosciences25
2.1Scanning NearField Optical Microscopy and Nanotechnology25
2.2Basic Concepts26
2.3Instrumentation27
2.3.1Probe Fabrication28
2.3.2Flexibility of NearField Measurements33
2.4Applications in Nanoscience35
2.4.1Fluorescence Microscopy35
2.4.2Raman Microscopy39
2.4.3Plasmonic and Photonic Nanostructures42
2.4.4Nanolithography47
2.4.5Semiconductors50
2.5Perspectives52
References53
3Scanning Tunneling Microscopy57
3.1Basic Principles of Scanning Tunneling Microscopy57
3.1.1Electronic Tunneling57
3.1.2Scanning Tunneling Microscope60
3.2Surface Structure Determination by Scanning Tunneling Microscopy61
3.2.1Semiconductor Surfaces62
3.2.2Metal Surfaces76
3.2.3Insulator Surfaces79
3.2.4Nanotubes and Nanowires81
3.2.5Surface and Subsurface Dynamic Processes83
3.3Scanning Tunneling Spectroscopies85
3.3.1Scanning Tunneling Spectroscopy85
3.3.2Inelastic Tunneling Spectroscopy87
3.3.3Local Work Function Measurement89
3.4STMBased Atomic Manipulation95
3.4.1Manipulation of Single atoms95
3.4.2STM Induced Chemical Reaction at Tip98
3.5Recent Developments 101
3.5.1SpinPolarized STM103
3.5.2UltraLow TemperatureSTM108
3.5.3DualTip STM110
3.5.4Variable Temperature FastScanning STM111
References113
4Visualization of Nanostructures with Atomic Force Microscopy119
4.1Introductory Remarks119
4.2Basics of Atomic Force Microscopy121
4.2.1Main Principle and Components of Atomic Force Microscope121
4.2.2Operational Modes, Optimization of the Experiment and Image Resolution128
4.2.3Imaging in Various Environments and at Different Temperatures135
4.3Imaging of Macromolecules and Their SelfAssemblies141
4.3.1Visualization of Single Polymer Chains141
4.3.2Alkanes, Polyethylene and Fluoroalkanes146
4.4Studies of Heterogeneous Systems154
4.4.1Semicrystalline Polymers154
4.4.2Block Copolymers155
4.4.3Polymer Blends and Nanocomposites158
4.5Concluding Remarks161
References162
5Scanning Probe Microscopy for Nanoscale Manipulation and Patterning165
5.1Introduction165
5.1.1Nanoscale Toolbox for Nanotechnologists165
5.1.2Motivations168
5.2Nanoscale Pen Writing170
5.2.1DipPen Nanolithography170
5.2.2Nanoscale Printing of Liquid Ink174
5.3Nanoscale Scratching176
5.3.1Nanoscale Indentation176
5.3.2Nanografting178
5.3.3Nanoscale Melting179
5.4Nanoscale Manipulation180
5.4.1Atomic and Molecular Manipulation180
5.4.2Manipulation of Nanostructures181
5.4.3Nanoscale Tweezers183
5.5Nanoscale Chemistry184
5.5.1Nanoscale Oxidation184
5.5.2Nanoscale Desorption of SelfAssembled Monolayers186
5.5.3Nanoscale Chemical Vapor Deposition187
5.6Nanoscale Light Exposure187
5.7Future Perspectives188
References190
6Scanning Thermal and Thermoelectric Microscopy195
6.1Introduction195
6.2Instrumentation of Scanning Thermal and Thermoelectric Microscopy196
6.2.1Instrumentation of Scanning Thermal Microscopy196
6.2.2Instrumentation of Scanning Thermoelectric Microscopy201
6.3Theory of Scanning Thermal and Thermoelectric Microscopy203
6.3.1Theory of Scanning Thermal Microscopy203
6.3.2Theory of Scanning Thermoelectric Microscopy208
6.4Applications of Scanning Thermal and Thermoelectric Microscopy in Nanotechnology209
6.4.1Thermal Imaging of Carbon Nanotube Electronics209
6.4.2Thermal Imaging of ULSI Devices and Interconnects212
6.4.3Shallow Junction Profiling213
6.5Summary and Future Aspects217
References217
7Imaging Secondary Ion Mass Spectrometry219
7.1Secondary Ion Mass Spectrometry and Nanotechnology219
7.2Introduction to Secondary Ion Mass Spectrometry220
7.2.1Overview220
7.2.2General SIMS Instruments221
7.2.3High Resolution Imaging SIMS Instruments223
7.3Experimental Issues in Imaging SIMS224
7.4Applications in Nanotechnology227
7.4.1Example—Precipitate Distributions in Metallurgy227
7.4.2Example—Heterogeneous Catalyst Studies229
7.4.3Example—Nanoscale Biological Structures232
7.5Summary and Future Perspectives233
References233
8Atom Probe Tomography237
8.1Atom Probe Tomography and Nanotechnology237
8.2Instrumentation of Atom Probe Tomography237
8.2.1Field Ion Microscope238
8.2.2Types of Atom Probe240
8.2.3Specimen Preparation246
8.3Basic Information247
8.4Data Interpretation and Visualization248
8.4.1Visualization Methods249
8.4.2Quantification Methods251
8.5Sample Analysis of Nanomaterials: Multilayer Films254
8.6Summary and Future Perspectives256
References256
9Focused Ion Beam System—a Multifunctional Tool for Nanotechnology259
9.1Introduction259
9.2Principles and Practice of the Focused Ion Beam System262
9.2.1Ion Beam Versus Electron Beam265
9.2.2Focused Ion Beam Microscope Versus Scanning Electron Microscope266
9.2.3Milling268
9.2.4Deposition270
9.2.5Implantation272
9.2.6Imaging273
9.2.7The DualBeam System275
9.3Application of Focused Ion Beam Instrumentation277
9.3.1Surface Structure Modification278
9.3.2Transmission Electron Microscopy Sample preparation for imaging and analysis288
9.3.3Sample Imaging—Defining the Third Dimension291
9.3.4Damage to the Sample Induced by the Focused Ion Beam294
References295
10Electron Beam Lithography299
10.1Electron Beam Lithography and Nanotechnology299
10.2Instrumentation of Electron Beam Lithography301
10.2.1Principle301
10.2.2Electron Optics302
10.3ElectronSolid Interactions313
10.3.1Electron Scattering in Solid313
10.3.2Proximity Effect314
10.3.3Electron Beam Resists314
10.4Pattern Transfer Process318
10.4.1Additive Processes318
10.4.2Subtractive Processes320
10.5Applications in Nanotechnology322
10.5.1Mask Making322
10.5.2Direct Writing325
10.6Summary and Future Perspectives330
References331
Index335 第1卷:光学显微学,扫描探针显微学,离子显微学和纳米制造-纳米技术中的显微学手册-图书简介:
第1卷:光学显微学,扫描探针显微学,离子显微学和纳米制造-纳米技术中的显微学手册-相关最新图书
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